Simulation circuit reliability simulation method based on dynamic step length

The invention discloses an analog circuit reliability simulation method based on dynamic step length, and mainly solves the problems that the prior art cannot fit the actual degradation condition of a device, and the simulation precision and speed cannot be considered at the same time. According to...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LYU SONGSONG, DONG XIAOYU, LI CONG, CHENG SHANLIN, YOU HAILONG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
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