Sequential test design method for response mutation

The invention discloses a sequential test design method for response mutation, and aims to solve the problem that a test result obtained based on uniform design and traditional sequential design is difficult to effectively reflect change characteristics of equipment performance, especially a perform...

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Bibliographische Detailangaben
Hauptverfasser: WANG HUABING, WANG YA, HAN HUI, WANG LIANDONG, ZHANG JINGKE, QI ZONGFENG, ZHU NING, SHEN XUJIAN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a sequential test design method for response mutation, and aims to solve the problem that a test result obtained based on uniform design and traditional sequential design is difficult to effectively reflect change characteristics of equipment performance, especially a performance mutation process when response mutation exists in a countermeasure test in a complex electromagnetic environment. The uniformity of the design scheme is described by using the reelable L2-deviation, the sudden change degree of test response is represented by using the gradient modulus value of the test point, the two are organically combined to define a target function, and the target function value is improved through continuous iteration to obtain the test design scheme. The test design scheme generated by the sequential test design method for response mutation provided by the invention is more densely distributed at the response mutation. 本发明公开了一种针对响应突变的序贯试验设计方法,意在解决复杂电磁环境下对抗试验中响应存在突变时,基于均匀设计和传统序贯设计获取的试验结果难