Wafer testing method and device and computer readable storage medium

The invention provides a wafer testing method and device and a computer readable storage medium, and is applied to the technical field of semiconductor testing. The method comprises the following steps: firstly, randomly dividing all tube cores containing to-be-detected tube cores in a Map graph formed by a probe machine into a plurality of Touchdown permutation combinations according to tube core permutation parameter values of a probe card, then, selecting the Touchdown permutation combination (an arrangement mode with the minimum Touchdown number) with the minimum probe card walking times from all the permutation combinations, and finally, selecting the Touchdown permutation combination from the selected Touchdown permutation combination (an arrangement mode with the minimum Touchdown number) with the minimum probe card walking times from the selected Touchdown permutation combination (the minimum Touchdown number arrangement mode) and the Touchdown permutation combination (the minimum Touchdown number arr