Sensor system, host unit, prediction device, and prediction method

According to the invention, abnormity or abnormity omen of the workpiece can be detected at an early stage. A sensor system (1) includes: a first sensor (30a) that measures a workpiece; a second sensor (30b) that measures the workpiece at a period that is relatively longer than that of the first sen...

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Bibliographische Detailangaben
Hauptverfasser: TAKAHASHI MASANORI, IIDA YUSUKE, TOMAGO NORIHIRO, TANISUE KOHEI, KATO YUTAKA
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:According to the invention, abnormity or abnormity omen of the workpiece can be detected at an early stage. A sensor system (1) includes: a first sensor (30a) that measures a workpiece; a second sensor (30b) that measures the workpiece at a period that is relatively longer than that of the first sensor (30a); and a host unit (10), the host unit (10) comprising: an acquisition unit (11) that acquires data measured by the first sensor (30a) and data measured by the second sensor (30b); and a generation unit (12) that generates learning data that is used for machine learning of a learning model, the acquired data of the first sensor (30a) being used as input data, and the acquired data of the second sensor (30b) being used as tag data indicating properties of the input data. 本发明能够在早期探测工件的异常或异常预兆。传感器系统1包括:第一传感器30a,对工件进行测定;第二传感器30b,以相对地比第一传感器30a长的周期来对工件进行测定;以及主机单元10,主机单元10包括:获取部11,获取由第一传感器30a所测定的数据与由第二传感器30b所测定的数据;以及生成部12,生成学习用数据,所述学习用数据被用于学习模型的机器学习,将所获取的第一传感器30a的数据作为输入数据,将所获取的第二传感器30b的数据作为表示输入数据的性质的标签数据。