Completeness test method based on Beidou full-chain fault excitation

The embodiment of the invention provides an integrity test method based on Beidou full-chain fault excitation, relates to the technical field of integrity risk testing, and aims at carrying out pressure testing on a Beidou full chain, traversing Beidou positioning service potential fault scenes and...

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Hauptverfasser: YAO YAO, ZHAO BINGQIU, CHEN SHUHENG, XIA HUI, LI XIN, CHEN JIALIN, LIU HAO, ZHANG XIN, ZHAO LEIMING, WU MINJIE, ZHONG LEISHENG, GE XUESHI, ZHU NIYAO, YE ZIQING, DING CHENCONG, LI LIANG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The embodiment of the invention provides an integrity test method based on Beidou full-chain fault excitation, relates to the technical field of integrity risk testing, and aims at carrying out pressure testing on a Beidou full chain, traversing Beidou positioning service potential fault scenes and realizing high-reliability integrity performance testing. The method comprises the following steps: step 1, setting an integrity performance test index, and initializing a fault scene to be tested; step 2, carrying out application platform test area range delimitation of a full link in a satellite-signal transmission-application platform; step 3, selecting a fault Beidou satellite; 4, simulating a Beidou satellite abnormal signal; the simulator performs simulation according to the signal of the fault Beidou satellite, and adds a certain error value according to the distance measurement of the fault Beidou satellite to obtain a simulated abnormal signal; and 5, carrying out integrity performance evaluation. 本发明实施例提供