Completeness test method based on Beidou full-chain fault excitation
The embodiment of the invention provides an integrity test method based on Beidou full-chain fault excitation, relates to the technical field of integrity risk testing, and aims at carrying out pressure testing on a Beidou full chain, traversing Beidou positioning service potential fault scenes and...
Gespeichert in:
Hauptverfasser: | , , , , , , , , , , , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The embodiment of the invention provides an integrity test method based on Beidou full-chain fault excitation, relates to the technical field of integrity risk testing, and aims at carrying out pressure testing on a Beidou full chain, traversing Beidou positioning service potential fault scenes and realizing high-reliability integrity performance testing. The method comprises the following steps: step 1, setting an integrity performance test index, and initializing a fault scene to be tested; step 2, carrying out application platform test area range delimitation of a full link in a satellite-signal transmission-application platform; step 3, selecting a fault Beidou satellite; 4, simulating a Beidou satellite abnormal signal; the simulator performs simulation according to the signal of the fault Beidou satellite, and adds a certain error value according to the distance measurement of the fault Beidou satellite to obtain a simulated abnormal signal; and 5, carrying out integrity performance evaluation.
本发明实施例提供 |
---|