GIS defect detection method based on X-ray imaging and Sobel-SCN

The invention discloses a GIS (Geographic Information System) defect detection method based on X-ray imaging and Sobel-SCN. The GIS defect detection method comprises the following steps: S1, acquiring an X-ray imaging of GIS equipment; s2, carrying out rotation, denoising, enhancement and binarization preprocessing on the image; s4, extracting image edge information based on a Sobel algorithm; s5, image edge contour information is perfected based on mathematical morphology; s6, segmenting the image, and calibrating the gravity center of the segmented image; s7, constructing a feature vector set; and S8, adopting a stochastic configuration network (SCN), taking the normalized characteristic vector set as an input, and classifying the characteristic vector set, so that the GIS defect identification is realized. According to the method, the X-ray image processing technology and the SCN algorithm are applied to GIS defect detection to replace inspection personnel to judge whether the GIS has defects or not, and t