Feature screening method and device, electronic equipment and storage medium

The invention provides a feature screening method and device, electronic equipment and a storage medium, and relates to the technical field of artificial intelligence, in particular to the technical field of deep learning and financial risk control. According to the specific implementation scheme, a plurality of first samples are obtained, the first samples comprise feature values corresponding to a plurality of candidate features, and the first samples have corresponding real labels; at least one second sample corresponding to the multiple first samples is obtained, and the second sample and the corresponding first sample have the same characteristic value; generating a pseudo tag corresponding to the second sample based on the plurality of first samples and the real tag; determining importance degrees of a plurality of candidate features in the corresponding first samples based on the plurality of second samples and the pseudo labels; and screening the plurality of candidate features according to the import