Data sampling inspection method and device, electronic equipment and storage medium
The embodiment of the invention provides a data sampling inspection method and device, electronic equipment and a storage medium, and the method comprises the steps: obtaining a target sampling inspection task from a first message queue, and enabling the first message queue to be used for managing a...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The embodiment of the invention provides a data sampling inspection method and device, electronic equipment and a storage medium, and the method comprises the steps: obtaining a target sampling inspection task from a first message queue, and enabling the first message queue to be used for managing all to-be-processed sampling inspection tasks, each sampling inspection task comprises a screening condition for screening a corresponding to-be-inspected object based on a time dimension; according to a target screening condition in the target sampling inspection task, obtaining a target inspected object from a target cache queue; wherein the target cache queue is used for caching to-be-detected objects obtained from a second message queue according to a preset mechanism, and the second message queue is used for managing all to-be-processed to-be-detected objects. According to the method, spot check processing can be carried out on the to-be-checked object in time under the condition that the system stability is no |
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