Abnormality detection method and device of intelligent equipment, electronic device and storage medium
The invention relates to an anomaly detection method and device of an intelligent device, an electronic device and a storage medium, and the method comprises the steps: obtaining to-be-detected data which is original data collected by a target intelligent device within a preset time, carrying out th...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to an anomaly detection method and device of an intelligent device, an electronic device and a storage medium, and the method comprises the steps: obtaining to-be-detected data which is original data collected by a target intelligent device within a preset time, carrying out the same-type intelligent analysis of the to-be-detected data, and obtaining the to-be-detected data which is the original data collected by the target intelligent device within the preset time; and obtaining a first intelligent analysis result of the target intelligent equipment, and reporting the intelligent abnormity of the target intelligent equipment under the condition of determining that the target intelligent equipment has the intelligent abnormity according to the first intelligent analysis result. The detection of the original data collected by the target intelligent device is realized by using the same type of intelligent analysis, so that the dependence on the time point when the target intelligent device |
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