Test circuit and test system

The invention relates to a test circuit and a test system. The test circuit comprises a load circuit, an operational amplifier circuit and a drive circuit. Wherein the load circuit comprises an MOS tube and a load resistor, a first electrode of the MOS tube is grounded through the load resistor, and a second electrode of the MOS tube is used for being connected with a tested power supply; the output end of the driving circuit is connected with the control electrode of the MOS tube, and the input end of the driving circuit is used for being connected with a driving signal generating circuit; the input end of the operational amplifier circuit is connected with at least one end of the load resistor, and the output end of the operational amplifier circuit is connected with the driving circuit; when the test circuit is in a working state, the signal voltage generated by the driving signal generation circuit is equal to the voltage of the output end of the operational amplifier circuit. According to the technical s