Multi/hyperspectral two-dimensional image processing
There is provided an apparatus (100) comprising one or more processors (102) configured to acquire multi/hyperspectral two-dimensional images of an object at respective wavelengths. For at least one pixel of an image corresponding to a first point on a surface of an object, a set of intensity values...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | There is provided an apparatus (100) comprising one or more processors (102) configured to acquire multi/hyperspectral two-dimensional images of an object at respective wavelengths. For at least one pixel of an image corresponding to a first point on a surface of an object, a set of intensity values for the at least one pixel is compared to a characteristic curve to determine a similarity metric. A first angle of the first point is estimated from a similarity metric, or a correction is applied to the image at the first point using the similarity metric. The characteristic curve is a difference between a spectrum of at least one second point on the object surface at a second angle relative to the plane of the image and a spectrum of at least one third point on the object surface at a third angle relative to the plane of the image.
提供了一种包括一个或多个处理器(102)的装置(100),该处理器(102)被配置为获取对象在相应波长处的多/高光谱二维图像。对于与对象表面上的第一点相对应的图像的至少一个像素,将针对所述至少一个像素的强度值集合与特性曲线进行比较,以确定相似性度量。根据相似性度量来估计第一点的第一角度,或者使用相似性度量在第一点处对图像应用校正。特性曲线是对象表面上的相对于图像 |
---|