Analog integrated circuit parameter optimization method and system
The invention discloses an analog integrated circuit parameter optimization method and system. The method comprises the following steps: acquiring a circuit structure, performance index requirements, circuit design parameters based on gm/ID design methodology and a value range thereof, an ID/W-gm/ID...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses an analog integrated circuit parameter optimization method and system. The method comprises the following steps: acquiring a circuit structure, performance index requirements, circuit design parameters based on gm/ID design methodology and a value range thereof, an ID/W-gm/ID lookup table and an iteration stop condition of an analog integrated circuit to be subjected to parameter optimization; according to the obtained circuit design parameters based on the gm/ID design methodology and the value range thereof, sampling to obtain a training sample set; respectively inputting each sample in the training sample set into a circuit simulator for simulation to obtain a corresponding training response set; and performing iterative processing based on the training sample set and the training response set to realize parameter optimization of the analog integrated circuit. According to the method, the circuit is optimized in the characteristic space of the circuit, the optimization effect of the |
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