External parameter calibration method, device and equipment and storage medium
The invention discloses an external parameter calibration method and device, equipment and a storage medium, and the method comprises the steps: obtaining first feature information and first pose information of a first sensor, and second feature information and second pose information of a second se...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses an external parameter calibration method and device, equipment and a storage medium, and the method comprises the steps: obtaining first feature information and first pose information of a first sensor, and second feature information and second pose information of a second sensor, the first feature information comprises third feature information and fourth feature information, and the second feature information comprises third feature information and fourth feature information; the second feature information comprises fifth feature information and sixth feature information; determining a first error parameter based on the first pose information, the second pose information and the initial external parameter; when the first error parameter is greater than the first preset error parameter, determining a calibration external parameter based on the third feature information and the fifth feature information; determining a second error parameter based on the fourth feature information, the |
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