Method for testing junction temperature of power amplifier chip

The invention provides a method for testing the junction temperature of a power amplifier chip, and the method comprises the following steps: building a test platform, fixing a T/R assembly or a power amplifier on the test platform, and setting the test parameters of the test platform; testing: with...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MA SHIHAO, GUO YUNXI, TU ZHENBIN, LEI OU, SUN BIN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS RADIATION PYROMETRY TESTING
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