Method and device for detecting surface defects of DFB laser chip

The invention relates to the field of testing devices, in particular to a DFB laser chip surface defect detection method and device, a conveying assembly is rotatably arranged on one side of a supporting assembly, an overturning plate is rotatably arranged on one side of the conveying assembly, and a clamping plate is slidably arranged on one side of the overturning plate; a chip can enter the position between the overturning plate and the clamping plate through the conveying assembly, the bottom plate is fixedly connected with the overturning plate, the second conveying line is rotationally arranged on one side of the overturning plate, after the chip is overturned by 180 degrees, the second conveying line can be moved to take out the chip, and the first detector is arranged on one side of the conveying assembly. The first detector is arranged on one side of the first conveying line and detects one face of the chip, the second detector is arranged on one side of the second conveying line and detects the othe