Testing system and testing method for radio frequency chip

The invention relates to the technical field of chip testing, and discloses a radio frequency chip testing system and a radio frequency chip testing method.According to the radio frequency chip testing system, a radio frequency interface module is arranged, and at least two first power dividers of t...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SUN MEIFANG, JIANG MING
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to the technical field of chip testing, and discloses a radio frequency chip testing system and a radio frequency chip testing method.According to the radio frequency chip testing system, a radio frequency interface module is arranged, and at least two first power dividers of the radio frequency interface module are connected with radio frequency input ports of at least two radio frequency chips; and the radio frequency output ports of the at least two radio frequency chips are connected to the signal measuring device through the second power divider and the third power divider of the radio frequency interface module, so that the test of the at least two radio frequency chips is realized, and the test efficiency of the radio frequency chips can be improved. 本申请涉及芯片测试技术领域,公开了一种射频芯片的测试系统及测试方法,该射频芯片的测试系统,通过设置射频接口模块,由射频接口模块的至少两个第一功分器连接至少两颗射频芯片的射频输入端口,由射频接口模块的第二功分器和第三功分器将至少两颗射频芯片的射频输出端口连接至信号测量装置,以实现至少两颗射频芯片的测试,本申请实施例能够提高射频芯片的测试效率。