STIL technology-based chip automatic test method, system and device

The invention discloses an automatic chip testing method, system and device based on the STIL technology, and the method comprises the steps: obtaining and analyzing to-be-tested data if a data loading instruction is received, and generating first testing data based on the STIL standard; analyzing the first test data to generate second test data; if a test execution instruction is received, testing according to the second test data to obtain a test result; and if a data analysis instruction is received, processing the test result, and generating third test data based on the STDF standard. According to the invention, the unified standard of chip testing can be realized. 本发明公开了一种基于STIL技术的芯片自动测试方法、系统及装置，所述方法包括：若接收到数据加载指令，获取待测数据并解析，生成基于STIL标准的第一测试数据；对所述第一测试数据进行解析，生成第二测试数据；若接收到测试执行指令，根据所述第二测试数据进行测试，得到测试结果；若接收到数据分析指令，对所述测试结果进行处理，生成基于STDF标准的第三测试数据。本发明可实现芯片测试统一标准。