Signal test system
The invention provides a signal testing system which comprises a PI module, an ALGO module and an EOM module, the PI module is used for receiving a plurality of initial clock signals which are orthogonal in pairs and a clock phase control signal sent by the ALGO module and outputting a target clock...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a signal testing system which comprises a PI module, an ALGO module and an EOM module, the PI module is used for receiving a plurality of initial clock signals which are orthogonal in pairs and a clock phase control signal sent by the ALGO module and outputting a target clock signal, and the EOM module is used for receiving a to-be-tested signal, the target clock signal and a threshold voltage control signal sent by the ALGO module and outputting the target clock signal. The EOM module is used for outputting a statistical result of sampling a to-be-detected signal, the ALGO module is used for receiving the statistical result, determining an eye width value and an eye height value of an eye pattern of the to-be-detected signal, and sampling and counting the to-be-detected signal by using a target clock signal input by the phase interpolation PI module and a threshold voltage control signal sent by the ALGO module through the EOM module; the ALGO module determines the eye width value and |
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