Method for controlling high and low temperature time error performance of automatic unlocking device

The invention belongs to the technical field of unlocking devices, and discloses a method for controlling high and low temperature time error performance of an automatic unlocking device, which comprises the following steps of: testing high and low temperature time errors of the automatic unlocking device, selecting unqualified automatic unlocking devices, and recording a time error value; disassembling an unqualified automatic unlocking device, carrying out dynamic balance measurement on an adjusting swing sheet and a balance wheel in the unqualified automatic unlocking device, carrying out balance repair on the unqualified automatic unlocking device after finding out the unbalance amount, and carrying out high and low normal temperature time error test again after the automatic unlocking device is installed again until the test passes. According to the tin sucking and heating device, tin sucking and heating are integrated, and a single person and a single device can implement work which needs to be complete