Test method and device for integrated circuit

The embodiment of the invention relates to an integrated circuit-oriented test method and device, and the method comprises the steps: carrying out the modeling of a tested integrated circuit, and obtaining a target test model of the tested integrated circuit; determining a test program of the tested integrated circuit based on the target test model; and testing the tested integrated circuit based on the test program, and determining a test result. Therefore, modeling of the model related to the test content can be completed before the test program is determined, and the method can be applied to different test software and has good universality. 本发明实施例涉及一种面向集成电路的测试方法、装置，包括：对被测集成电路进行建模，得到所述被测集成电路的目标测试模型；基于所述目标测试模型确定所述被测集成电路的测试程序；基于所述测试程序对所述被测集成电路进行测试，确定测试结果。由此，可以实现在确定测试程序之前，完成与测试内容相关的模型建模，可应用于不同的测试软件中，具有较好的通用性。