High electron mobility transistor and manufacturing method thereof

The invention discloses a high electron mobility transistor. The high electron mobility transistor comprises a substrate; the channel layer is arranged on the substrate; the aluminum gallium nitride layer is arranged on the channel layer; the P-type gallium nitride gate is arranged on the aluminum g...

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Hauptverfasser: CHEN YANXING, WANG YUREN, YANG ZONGMU, XU YOUMING
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a high electron mobility transistor. The high electron mobility transistor comprises a substrate; the channel layer is arranged on the substrate; the aluminum gallium nitride layer is arranged on the channel layer; the P-type gallium nitride gate is arranged on the aluminum gallium nitride layer, the aluminum gallium nitride layer comprises a first region and a second region, and the composition of the first region is different from that of the second region. 本发明公开一种高电子迁移率晶体管,包含一基底;一通道层,设于所述基底上;一氮化铝镓层,设于所述通道层上;以及一P型氮化镓栅,设于所述氮化铝镓层上,其中,所述氮化铝镓层包含一第一区域和一第二区域,又其中,所述第一区域的组成不同于所述第二区域的组成。