Fault analysis method and device for machine room equipment, computer equipment and storage medium
The invention relates to the technical field of big data, in particular to a fault analysis method and device for machine room equipment, computer equipment, a storage medium and a computer program product. The method comprises the following steps: acquiring a plurality of target inspection data obt...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to the technical field of big data, in particular to a fault analysis method and device for machine room equipment, computer equipment, a storage medium and a computer program product. The method comprises the following steps: acquiring a plurality of target inspection data obtained by inspecting machine room equipment in a current detection period; and if more than one alarm signal is received in the current detection period, simulating a fault simulation operation state of machine room equipment through a digital simulation model corresponding to the machine room based on the plurality of pieces of target inspection data and abnormal data carried by each alarm signal. And based on the fault simulation operation state and each abnormal data, determining a fault position in the machine room equipment according to the fault mapping relation in the digital simulation model. And determining related abnormal data related to each fault position from the plurality of abnormal data, and determi |
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