Ectopic acquisition method for vertical structure of plant leaf area

The invention relates to an ectopic acquisition method of a plant leaf area vertical structure. The plant leaf area is not only related to the leaf areas of all single leaves, but also related to spatial arrangement, so that the plant leaf area vertical structure is calculated by using the plant lea...

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Bibliographische Detailangaben
Hauptverfasser: CHEN YANG, LI KEXIANG, XING DAN, XIAO JIUJUN, ZHANG LANYUE, XIE YUANGUI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention relates to an ectopic acquisition method of a plant leaf area vertical structure. The plant leaf area is not only related to the leaf areas of all single leaves, but also related to spatial arrangement, so that the plant leaf area vertical structure is calculated by using the plant leaf area data and the plant feature point data, and the invention provides a novel ectopic acquisition method for the plant leaf area vertical structure. The method provides a basis for carefully describing the spatial differentiation condition of photosynthesis of plant leaves and for plant cultivation and variety breeding, and has important application value. 本发明涉及一种植株叶面积垂直结构的异位获取方法。植株叶面积不仅与其所有单叶叶面积相关,还与空间排布相关,为此,本发明利用植株叶面积数据和植株特征点数据计算植株叶面积垂直结构,本发明提供了一种新的植株叶面积垂直结构的异位获取方法,为细致刻画植物叶片光合作用空间分异状况,为植物栽培、品种选育提供基础,具有重要的应用价值。