Test system
A test system is used for testing a device under test in the air. The test system includes a test location for the device under test, a reflector facing the test location, and a measurement feed antenna directed toward the reflector, thereby establishing a signal path between the measurement feed an...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | A test system is used for testing a device under test in the air. The test system includes a test location for the device under test, a reflector facing the test location, and a measurement feed antenna directed toward the reflector, thereby establishing a signal path between the measurement feed antenna and the test location through the reflector. The test system includes a positioner for the device under test that is capable of rotating the device under test to at least four different measurement positions of the device under test. The testing system comprises a second measuring antenna, and when the tested device is placed at the testing position, the position of the second measuring antenna deviates from the center of the side face, facing the second measuring antenna, of the tested device. A method of testing a device under test over the air is also disclosed.
一种测试系统,用于在空中测试被测设备。该测试系统包括用于被测设备的测试位置、面向测试位置的反射器和指向反射器的测量馈送天线,从而通过反射器在测量馈送天线和测试位置之间建立信号路径。该测试系统包括用于被测设备的定位器,其能够将被测设备旋转到被测设备的至少四个不同的测量位置。该测试系统包括第二测 |
---|