Inspection apparatus and system, ultrasonic diagnostic apparatus, acoustic coupling apparatus, and storage medium

The invention relates to an examination apparatus and system, an ultrasonic diagnostic apparatus, an acoustic coupling apparatus, and a storage medium. An inspection apparatus according to an embodiment includes a detection unit and an inspection unit. An inspection apparatus according to an embodim...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MAKITA YASUHISA, OGASAWARA YOICHI
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to an examination apparatus and system, an ultrasonic diagnostic apparatus, an acoustic coupling apparatus, and a storage medium. An inspection apparatus according to an embodiment includes a detection unit and an inspection unit. An inspection apparatus according to an embodiment includes a detection unit and an inspection unit. The detection unit detects the waveform of a reflected wave transmitted by an ultrasonic probe, reflected by an acoustic coupling material in close contact with an acoustic emission surface of the ultrasonic probe, and passed through the acoustic coupling material. The inspection unit inspects the performance of the ultrasonic probe on the basis of the waveform detected by the detection unit. 本发明涉及检查装置和系统、超声波诊断装置、声耦合装置及存储介质。实施方式的检查装置具有检测部以及检查部。实施方式的检查装置具有检测部以及检查部。检测部检测由超声波探头发送并通过了与上述超声波探头的声放射面紧贴的声耦合材的超声波反射而通过了上述声耦合材的反射波的波形。检查部基于由上述检测部检测到的波形,检查上述超声波探头的性能。