Probe calibration method and device, electronic equipment and storage medium
The invention discloses a probe calibration method and device, electronic equipment and a storage medium. The method comprises the following steps: acquiring a first probe resistance value and an initial probe height of a probe at a first preset calibration position; obtaining a probe calibration he...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a probe calibration method and device, electronic equipment and a storage medium. The method comprises the following steps: acquiring a first probe resistance value and an initial probe height of a probe at a first preset calibration position; obtaining a probe calibration height according to the first probe resistance value and the initial probe height; acquiring a first probe coordinate of the probe at a second preset calibration position, acquiring a first camera coordinate and a second camera coordinate of the camera at the first probe coordinate, and acquiring a center point coordinate of the camera; obtaining a second probe coordinate according to the first probe coordinate, the first camera coordinate, the second camera coordinate and the central point coordinate; obtaining calibration coordinates of the probe according to the probe calibration height and the second probe coordinates; and performing calibration processing on the probe according to the calibration coordinates. Ac |
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