Probe calibration method and device, electronic equipment and storage medium

The invention discloses a probe calibration method and device, electronic equipment and a storage medium. The method comprises the following steps: acquiring a first probe resistance value and an initial probe height of a probe at a first preset calibration position; obtaining a probe calibration he...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: HUANG LONG, WANG XINGYOU, NIE RONGGANG, SHAO YONGFENG, HUANG LIANG
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention discloses a probe calibration method and device, electronic equipment and a storage medium. The method comprises the following steps: acquiring a first probe resistance value and an initial probe height of a probe at a first preset calibration position; obtaining a probe calibration height according to the first probe resistance value and the initial probe height; acquiring a first probe coordinate of the probe at a second preset calibration position, acquiring a first camera coordinate and a second camera coordinate of the camera at the first probe coordinate, and acquiring a center point coordinate of the camera; obtaining a second probe coordinate according to the first probe coordinate, the first camera coordinate, the second camera coordinate and the central point coordinate; obtaining calibration coordinates of the probe according to the probe calibration height and the second probe coordinates; and performing calibration processing on the probe according to the calibration coordinates. Ac