Processing method, processing device and processing system

The invention discloses a processing method, a processing device and a processing system, and the method, the device and the system are used for carrying out the spectral image collection of a to-be-collected object composed of a detection object and a background object, and obtaining a first spectral image according to the spectral features of different image regions in the collected first spectral image. Identifying attribute parameters of a to-be-collected object corresponding to different image areas, the identified attribute parameters being related to a material of the to-be-collected object, and then positioning and extracting a second spectral image corresponding to the detection object in the first spectral image according to the attribute parameters corresponding to different image areas in the first spectral image, and carrying out anomaly detection on the detection object based on the region features of different image regions in the second spectral image. 本申请公开一种处理方法及处理装置、处理系统，该方法、装置及系统对检测对象及其背景对