Sampling inspection method and system for LED crystal grains

The invention discloses a spot check method and system for LED crystal grains, and the method comprises the steps: testing an LED wafer, so as to obtain the test data of the LED crystal grains; according to the test data of the LED crystal grains, the LED crystal grains are divided into a plurality of classification grades, necessary grades are selected from the classification grades, the LED crystal grains corresponding to the necessary grades are necessary crystal grains, and the LED crystal grains are from at least one wafer; arranging the LED crystal grains on different square sheets according to classification grades to obtain a plurality of finished square sheets; a square piece to be sampled is selected from the finished square piece, the LED crystal grains on the square piece to be sampled are first sampled crystal grains, and the first sampled crystal grains comprise crystal grains required to be sampled from any LED wafer; and testing the first casually inspected crystal grains on the square sheet t