Slide sample analysis system

The invention relates to a slide sample analysis system which comprises an automatic slide taking and placing module, a frame module, a slide bin module, at least one microscope module and at least one broadband damping module, and the automatic slide taking and placing module comprises a large four...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: XIE XIAOHONG, HUANG JINGPENG, XIE SHILING
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to a slide sample analysis system which comprises an automatic slide taking and placing module, a frame module, a slide bin module, at least one microscope module and at least one broadband damping module, and the automatic slide taking and placing module comprises a large four-dimensional motion platform and at least one small three-dimensional motion platform. The large four-dimensional motion platform and the small three-dimensional motion platform circularly and sequentially clamp and place slides, the microscope module is mounted behind the small three-dimensional motion platform, the broadband damping module is mounted at the bottoms of the microscope module and the small three-dimensional motion platform, and a glass slide clamping mechanism is mounted on the large four-dimensional motion platform. According to the invention, the movement stroke is greatly reduced, the whole inspection time is shortened, and the inspection efficiency can be effectively improved through parallel us