Method and device for determining compact sandstone microfracture development degree and storage medium

The invention discloses a method for determining the development degree of a micro-fracture of tight sandstone, which comprises the following steps: analyzing the surface porosity of the micro-fracture of a tight sandstone sample to represent the development degree of a micro-fracture stratum of the...

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Bibliographische Detailangaben
Hauptverfasser: FU WEISHU, NAN ZEYU, WU JIE, LI HAO
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a method for determining the development degree of a micro-fracture of tight sandstone, which comprises the following steps: analyzing the surface porosity of the micro-fracture of a tight sandstone sample to represent the development degree of a micro-fracture stratum of the tight sandstone; according to the deep resistivity and the flushing zone resistivity of the compact sandstone sample, the resistivity difference degree of the micro-fracture stratum of the compact sandstone is determined; based on the logging curve, the wave impedance of the micro-fracture stratum is calculated through logging sound waves and logging density; carrying out statistical analysis on the relationship among the development degree, the resistivity difference degree and the wave impedance of the micro-fracture stratum, and establishing a calculation formula for determining the development degree of the micro-fracture according to the resistivity difference degree and the wave impedance; and estimating the