Crop yield estimation method and device

The embodiment of the invention discloses a crop yield estimation method and device. According to the technical scheme provided by the embodiment of the invention, the crop image information and the crop elevation information of the target area are collected; performing image analysis based on the c...

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Bibliographische Detailangaben
1. Verfasser:	LUO XINYONG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	The embodiment of the invention discloses a crop yield estimation method and device. According to the technical scheme provided by the embodiment of the invention, the crop image information and the crop elevation information of the target area are collected; performing image analysis based on the crop image information, and determining a crop image difference index of the target area; performing growth height analysis based on the crop elevation information, and determining a crop height difference index of the target area; and calculating the crop estimated yield of the target area according to the crop image difference index and the crop height difference index. By adopting the technical means, the crop yield is estimated by combining the crop image information and the crop growth height information, so that more accurate crop yield estimation can be realized, and the crop yield estimation accuracy is improved. In addition, agricultural production management decision making is carried out based on the crop