Sub-aperture optical axis calibration device and method and application

The invention discloses a sub-aperture optical axis calibration device and method and application, and belongs to the technical field of optical axis calibration of a photoelectric detection system. The device comprises a parabolic mirror, a secondary mirror, a target plate and a composite light sou...

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Hauptverfasser: PAN ZHIFENG, JIN CHENJIE
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a sub-aperture optical axis calibration device and method and application, and belongs to the technical field of optical axis calibration of a photoelectric detection system. The device comprises a parabolic mirror, a secondary mirror, a target plate and a composite light source, and the parabolic mirror and the secondary mirror adopt off-axis design and are fixed through a structural supporting piece to jointly form an optical light pipe of the axis calibration device; the target plate is located at the focal plane position of the optical lens, and the composite light source is located behind the target plate and clings to the target plate. The target plate realizes absorption and conversion through the laser infrared optical conversion material on the surface of the target plate to form an infrared observable target point; a circular through hole is engraved in the center of the target plate, and a babysbreath or four-bar target pattern is engraved around the circular hole to serve a