Metering index anomaly analysis method, device, equipment and medium
The invention discloses a metering index anomaly analysis method, device and equipment and a medium. The method comprises the steps of obtaining the file data and operation data of each target metering terminal associated with a metering index at a current moment when the metering index is abnormal,...
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| creator | CAI MIAOZHUANG PENG ZHENGYANG LI HUI DU JINYANG CUI ZHUO ZHENG YIN LIU CHANG CHEN KAIYAN WU XIAOQIANG GU HAITONG CHEN SHAOLIANG WEN XIN |
| description | The invention discloses a metering index anomaly analysis method, device and equipment and a medium. The method comprises the steps of obtaining the file data and operation data of each target metering terminal associated with a metering index at a current moment when the metering index is abnormal, performing fault analysis on the file data and the operation data through a preset fault classification model to obtain a fault combination corresponding to each target metering terminal, and counting the frequencies of the fault combinations of all the target metering terminals, and outputting the fault combination with the highest frequency. The technical problems that in the prior art, the workload is large and the efficiency is low due to the fact that index anomaly analysis is carried out by combining expert judgment with a field operation and maintenance troubleshooting method are solved.
本申请公开了一种计量指标异常分析方法、装置、设备和介质，方法包括：在计量指标出现异常时，获取与该计量指标关联的各目标计量终端在当前时刻的档案数据和运行数据；通过预置故障分类模型对档案数据和运行数据进行故障分析，得到各目标计量终端对应的故障组合 |
| format | Patent |
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本申请公开了一种计量指标异常分析方法、装置、设备和介质，方法包括：在计量指标出现异常时，获取与该计量指标关联的各目标计量终端在当前时刻的档案数据和运行数据；通过预置故障分类模型对档案数据和运行数据进行故障分析，得到各目标计量终端对应的故障组合</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ; HANDLING RECORD CARRIERS ; PHYSICS ; PRESENTATION OF DATA ; RECOGNITION OF DATA ; RECORD CARRIERS ; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220218&DB=EPODOC&CC=CN&NR=114066265A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220218&DB=EPODOC&CC=CN&NR=114066265A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CAI MIAOZHUANG</creatorcontrib><creatorcontrib>PENG ZHENGYANG</creatorcontrib><creatorcontrib>LI HUI</creatorcontrib><creatorcontrib>DU JINYANG</creatorcontrib><creatorcontrib>CUI ZHUO</creatorcontrib><creatorcontrib>ZHENG YIN</creatorcontrib><creatorcontrib>LIU CHANG</creatorcontrib><creatorcontrib>CHEN KAIYAN</creatorcontrib><creatorcontrib>WU XIAOQIANG</creatorcontrib><creatorcontrib>GU HAITONG</creatorcontrib><creatorcontrib>CHEN SHAOLIANG</creatorcontrib><creatorcontrib>WEN XIN</creatorcontrib><title>Metering index anomaly analysis method, device, equipment and medium</title><description>The invention discloses a metering index anomaly analysis method, device and equipment and a medium. The method comprises the steps of obtaining the file data and operation data of each target metering terminal associated with a metering index at a current moment when the metering index is abnormal, performing fault analysis on the file data and the operation data through a preset fault classification model to obtain a fault combination corresponding to each target metering terminal, and counting the frequencies of the fault combinations of all the target metering terminals, and outputting the fault combination with the highest frequency. The technical problems that in the prior art, the workload is large and the efficiency is low due to the fact that index anomaly analysis is carried out by combining expert judgment with a field operation and maintenance troubleshooting method are solved.
本申请公开了一种计量指标异常分析方法、装置、设备和介质，方法包括：在计量指标出现异常时，获取与该计量指标关联的各目标计量终端在当前时刻的档案数据和运行数据；通过预置故障分类模型对档案数据和运行数据进行故障分析，得到各目标计量终端对应的故障组合</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</subject><subject>HANDLING RECORD CARRIERS</subject><subject>PHYSICS</subject><subject>PRESENTATION OF DATA</subject><subject>RECOGNITION OF DATA</subject><subject>RECORD CARRIERS</subject><subject>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHDxTS1JLcrMS1fIzEtJrVBIzMvPTcypBNJAsjizWCE3tSQjP0VHISW1LDM5VUchtbA0syA3Na8EqCQFKJuSWZrLw8CalphTnMoLpbkZFN1cQ5w9dFML8uNTiwsSk1PzUkvinf0MDU0MzMyMzEwdjYlRAwCp0zKm</recordid><startdate>20220218</startdate><enddate>20220218</enddate><creator>CAI MIAOZHUANG</creator><creator>PENG ZHENGYANG</creator><creator>LI HUI</creator><creator>DU JINYANG</creator><creator>CUI ZHUO</creator><creator>ZHENG YIN</creator><creator>LIU CHANG</creator><creator>CHEN KAIYAN</creator><creator>WU XIAOQIANG</creator><creator>GU HAITONG</creator><creator>CHEN SHAOLIANG</creator><creator>WEN XIN</creator><scope>EVB</scope></search><sort><creationdate>20220218</creationdate><title>Metering index anomaly analysis method, device, equipment and medium</title><author>CAI MIAOZHUANG ; PENG ZHENGYANG ; LI HUI ; DU JINYANG ; CUI ZHUO ; ZHENG YIN ; LIU CHANG ; CHEN KAIYAN ; WU XIAOQIANG ; GU HAITONG ; CHEN SHAOLIANG ; WEN XIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN114066265A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</topic><topic>HANDLING RECORD CARRIERS</topic><topic>PHYSICS</topic><topic>PRESENTATION OF DATA</topic><topic>RECOGNITION OF DATA</topic><topic>RECORD CARRIERS</topic><topic>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>CAI MIAOZHUANG</creatorcontrib><creatorcontrib>PENG ZHENGYANG</creatorcontrib><creatorcontrib>LI HUI</creatorcontrib><creatorcontrib>DU JINYANG</creatorcontrib><creatorcontrib>CUI ZHUO</creatorcontrib><creatorcontrib>ZHENG YIN</creatorcontrib><creatorcontrib>LIU CHANG</creatorcontrib><creatorcontrib>CHEN KAIYAN</creatorcontrib><creatorcontrib>WU XIAOQIANG</creatorcontrib><creatorcontrib>GU HAITONG</creatorcontrib><creatorcontrib>CHEN SHAOLIANG</creatorcontrib><creatorcontrib>WEN XIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CAI MIAOZHUANG</au><au>PENG ZHENGYANG</au><au>LI HUI</au><au>DU JINYANG</au><au>CUI ZHUO</au><au>ZHENG YIN</au><au>LIU CHANG</au><au>CHEN KAIYAN</au><au>WU XIAOQIANG</au><au>GU HAITONG</au><au>CHEN SHAOLIANG</au><au>WEN XIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Metering index anomaly analysis method, device, equipment and medium</title><date>2022-02-18</date><risdate>2022</risdate><abstract>The invention discloses a metering index anomaly analysis method, device and equipment and a medium. The method comprises the steps of obtaining the file data and operation data of each target metering terminal associated with a metering index at a current moment when the metering index is abnormal, performing fault analysis on the file data and the operation data through a preset fault classification model to obtain a fault combination corresponding to each target metering terminal, and counting the frequencies of the fault combinations of all the target metering terminals, and outputting the fault combination with the highest frequency. The technical problems that in the prior art, the workload is large and the efficiency is low due to the fact that index anomaly analysis is carried out by combining expert judgment with a field operation and maintenance troubleshooting method are solved.
本申请公开了一种计量指标异常分析方法、装置、设备和介质，方法包括：在计量指标出现异常时，获取与该计量指标关联的各目标计量终端在当前时刻的档案数据和运行数据；通过预置故障分类模型对档案数据和运行数据进行故障分析，得到各目标计量终端对应的故障组合</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES HANDLING RECORD CARRIERS PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR |
| title | Metering index anomaly analysis method, device, equipment and medium |
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