Metering index anomaly analysis method, device, equipment and medium

The invention discloses a metering index anomaly analysis method, device and equipment and a medium. The method comprises the steps of obtaining the file data and operation data of each target metering terminal associated with a metering index at a current moment when the metering index is abnormal,...

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Hauptverfasser: CAI MIAOZHUANG, PENG ZHENGYANG, LI HUI, DU JINYANG, CUI ZHUO, ZHENG YIN, LIU CHANG, CHEN KAIYAN, WU XIAOQIANG, GU HAITONG, CHEN SHAOLIANG, WEN XIN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a metering index anomaly analysis method, device and equipment and a medium. The method comprises the steps of obtaining the file data and operation data of each target metering terminal associated with a metering index at a current moment when the metering index is abnormal, performing fault analysis on the file data and the operation data through a preset fault classification model to obtain a fault combination corresponding to each target metering terminal, and counting the frequencies of the fault combinations of all the target metering terminals, and outputting the fault combination with the highest frequency. The technical problems that in the prior art, the workload is large and the efficiency is low due to the fact that index anomaly analysis is carried out by combining expert judgment with a field operation and maintenance troubleshooting method are solved. 本申请公开了一种计量指标异常分析方法、装置、设备和介质,方法包括:在计量指标出现异常时,获取与该计量指标关联的各目标计量终端在当前时刻的档案数据和运行数据;通过预置故障分类模型对档案数据和运行数据进行故障分析,得到各目标计量终端对应的故障组合