Integrated circuit crater experiment method

The invention discloses an integrated circuit crater experiment method. The integrated circuit crater experiment method comprises the following steps: removing a plastic package body of an integrated circuit product to expose a chip surface of the integrated circuit product; soaking the integrated c...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	ZHANG MEIXUAN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MIXING, e.g. DISSOLVING, EMULSIFYING, DISPERSING PERFORMING OPERATIONS PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL PHYSICS TESTING TRANSPORTING
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