MULTI-LANE OPTICAL-ELECTRICAL DEVICE TESTING USING AUTOMATED TESTING EQUIPMENT

A hybrid automated testing equipment (ATE) system can simultaneously test electrical and optical components of a device under test, such as an optical transceiver. The device under test can be a multilane optical transceiver that transmits different channels of data on different lanes. The hybrid AT...

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Bibliographische Detailangaben
1. Verfasser: KECK STEVEN WILLIAM
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:A hybrid automated testing equipment (ATE) system can simultaneously test electrical and optical components of a device under test, such as an optical transceiver. The device under test can be a multilane optical transceiver that transmits different channels of data on different lanes. The hybrid ATE system can include one or more light sources and optical switches in an optical test lane selector to selectively test and calibrate each optical and electrical components of each lane of the device under test. 混合自动化测试设备(ATE)系统可以同时测试被测器件(例如光收发器)的电气和光学部件。被测器件可以是在不同通道上传输不同数据通道的多通道光收发器。混合ATE系统可以包括在一个光学测试通道选择器中的一个或多个光开关和光源,以选择性地测试和校准被测器件的每个通道的每个光学和电气部件。