Post-event analysis method and device for ionosphere model
The invention provides a post-analysis method and device for an ionosphere model. The device comprises a global range total electron content analysis module, an ionosphere delay calculation module and an ionosphere model judgment module. The ionosphere delay calculation module calculates a BDS-3 ion...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a post-analysis method and device for an ionosphere model. The device comprises a global range total electron content analysis module, an ionosphere delay calculation module and an ionosphere model judgment module. The ionosphere delay calculation module calculates a BDS-3 ionosphere delay correction value based on a BDGIM model through ionosphere parameters, and further obtains a vertical total electron content value under the position and time of the receiver; and the ionosphere delay calculation module further comprises the steps of improving a traditional Klobuchar model, performing least square estimation on parameters in the model in combination with carrier phase observed quantity, and calculating a BDS-2 ionosphere delay correction value. The ionosphere delay data analysis efficiency is improved, the correction effects of the BDS-2 ionosphere model and the BDS-3 ionosphere model can be compared and checked, whether the positioning precision of the area where the receiver is loca |
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