Method for measuring weight of zinc layer by X-ray fluorescence method
The invention discloses a method for measuring the weight of a zinc layer by using an X-ray fluorescence method, relates to the technical field of metallurgical material analysis, and aims to solve the problems that the reliability of detection data is not high and manual secondary detection is need...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a method for measuring the weight of a zinc layer by using an X-ray fluorescence method, relates to the technical field of metallurgical material analysis, and aims to solve the problems that the reliability of detection data is not high and manual secondary detection is needed when the detection range of measuring the weight of the zinc layer of a galvanized plate by using an X-ray fluorescence spectrophotometer is relatively large. The method comprises the following steps: preparing standard samples with different contents, and accurately measuring the zinc layer weight of the standard samples by adopting a gravimetric method; respectively establishing a primary calibration curve measurement method and a secondary calibration curve measurement method on the X-ray luminometers manufactured by the manufacturer A and the manufacturer B by using the standard samples and the measurement result of the gravimetric method; respectively measuring a blind sample by using two X-ray fluorescence |
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