FRACTURE SURFACE ANALYSIS APPARATUS AND FRACTURE SURFACE ANALYSIS METHOD

Provided are a fracture surface analysis apparatus and a fracture surface analysis method which enable a non-expert to conduct a fracture surface analysis just as well as an expert does. This fracture surface analysis apparatus is characterized by including a microscopic region observation unit that...

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Hauptverfasser: UEKI YOSUKE, ISOZAKI YOHEI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:Provided are a fracture surface analysis apparatus and a fracture surface analysis method which enable a non-expert to conduct a fracture surface analysis just as well as an expert does. This fracture surface analysis apparatus is characterized by including a microscopic region observation unit that is provided with a first means for calculating an accuracy of fracture mode by using a first observation image, of a microscopic region of a to-be-analyzed object, acquired by an imaging means, a second means for calculating an observation condition for improving the accuracy of the fracture mode, and a third means for adjusting conditions for imaging the microscopic region by the imaging means, and that outputs the accuracy of fracture mode and the observation condition for improving the accuracy of fracture mode to a visualization means. 本发明提供一种断口分析装置和断口分析方法,使得非熟练人员也能够实施与熟练人员同样的断口分析。其特征在于,包括微观区域观察部,该微观区域观察部包括:第一单元,其针对被分析物的由微观区域的摄像单元得到的第一观察像,计算破坏模式的准确度;第二单元,其计算能够提高破坏模式的准确度的观察条件;和第三单元,其调节微观区域的摄像单元的拍摄条件,并且,将破坏模式的准确