Method for testing technical system and for determining test coverage of test of system to be tested

The invention relates to a computer-implemented method (100) for determining the sufficiency of a test of a system to be tested, and the method comprises the following steps: providing (110) test parameters (q) and test results of a test set, in particular of a successfully implemented test set; det...

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Bibliographische Detailangaben
Hauptverfasser: OEHLERKING JENS, VIETINGHOFF ANNE VON
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to a computer-implemented method (100) for determining the sufficiency of a test of a system to be tested, and the method comprises the following steps: providing (110) test parameters (q) and test results of a test set, in particular of a successfully implemented test set; determining (120) a parameter set (p) for the respective test, wherein the parameter set comprises a test parameter (p) for which the respective test is indicative; determining (130), based on the parameter set (p) of the respective test, a test space (S), in particular an n-dimensional test space, for which said respective test of the respective test is indicative; determining (140) whether a union of the test spaces (S) to be tested covers a predeterminable total test space (T), in particular an n-dimensional total test space. 本发明涉及一种用于确定待测系统的测试的充分性的计算机实现的方法(100),所述方法包括如下步骤:提供(110)测试集合的、尤其是成功实施的测试集合的测试参数(q)和测试结果;针对相应测试确定(120)参数集(p),其中参数集包括相应测试对其来说是指示性的测试参数(p);基于相应测试的参数集(p),确定(130)相应测试的所述相应测试对其来说是指示性的测试空间(S)、尤其是n维测试空