Protection device and protection method of semiconductor device

The invention discloses a protection device and method for a semiconductor device, and the device comprises a first blocking ring which surrounds the semiconductor device, wherein the semiconductor device is located at the central position of the first blocking ring; a second blocking ring which concentrically surrounds the first blocking ring, wherein the first blocking ring and the second blocking ring are isolated through a medium; a first test circuit, wherein two ends of the first test circuit are electrically connected with the first blocking ring; and a second test circuit, wherein two ends of the second test circuit are electrically connected with the second blocking ring. According to the protection device and the protection method of the semiconductor device, the accuracy of reliability testing can be improved. 本发明公开了一种半导体器件的保护装置及保护方法，所述半导体器件的保护装置包括：第一阻挡环，环绕所述半导体器件，且所述半导体器件位于所述第一阻挡环的中心位置；第二阻挡环，同心环绕所述第一阻挡环，且所述第一阻挡环和所述第二阻挡环之间通过介质隔离；第一测试电路，两端与所述第一阻挡环电性连接；以及第二测试电路，两端与所述第二阻挡环电性连接。通过本发明提供的一种半导体器件的保护装置及保护方