Ray source fine tuning system and method
The invention relates to a ray source fine tuning system and method. The ray source fine tuning system comprises a supporting frame, a detection plate, an adjusting device and a controller; the supporting frame can be located at a plate seam of the main detection plate; the detection plate is arrang...
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Zusammenfassung: | The invention relates to a ray source fine tuning system and method. The ray source fine tuning system comprises a supporting frame, a detection plate, an adjusting device and a controller; the supporting frame can be located at a plate seam of the main detection plate; the detection plate is arranged on the supporting frame, the length direction of the detection plate is perpendicular to the length direction of the supporting frame, and the detection plate can receive rays emitted by the ray source; the adjusting device is used for adjusting the position of the radiation source relative to the main detection plate; and the controller is used for acquiring the ray energy value on the detection plate and controlling the adjusting device to adjust the ray source. According to the ray source fine tuning system, the detection plate receives the X rays emitted by the ray source, the controller obtains the ray energy value on the detection plate and judges whether the position of the highest ray energy value receiv |
|---|