Method for photometric characterization of optical radiation properties of light source and radiation source
One aspect of the invention relates to a method for photometric characterization of the optical radiation properties of a light source and a radiation source. The invention relates to a method for photometric mapping of the light source, which is held in a positioning device (1) and is stationary re...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | One aspect of the invention relates to a method for photometric characterization of the optical radiation properties of a light source and a radiation source. The invention relates to a method for photometric mapping of the light source, which is held in a positioning device (1) and is stationary relative to an object coordinate system (T), by means of a light intensity measurement camera arranged stationary relative to a world coordinate system (W), wherein the light source is moved in the world coordinate system along a kinematic chain of the positioning device between a first actual measurement position and at least one further actual measurement position, a light intensity measurement image describing a spatial distribution of the photometric characteristic within the measurement surface is recorded by means of the light intensity measurement camera at each actual measurement position, and the position and/or orientation of the object coordinate system relative to the world coordinate system is recorded a |
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