Optical waveguide parameter measuring method and device
The invention discloses an optical waveguide parameter measuring method and device and belongs to the technical field of optical waves. The time domain and/or frequency spectrum change condition of optical pulses under different input conditions under the combined action of non-linearity, dispersion...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The invention discloses an optical waveguide parameter measuring method and device and belongs to the technical field of optical waves. The time domain and/or frequency spectrum change condition of optical pulses under different input conditions under the combined action of non-linearity, dispersion and high-order dispersion parameters of a waveguide to be measured is controlled, a non-linear transmission equation is matched with a parameter search algorithm, and multivariable search is directly carried out on the parameters to be measured by using measurement data; meanwhile, the numerical values of the nonlinear and dispersion parameters of the to-be-measured waveguide are obtained.
一种光波导参数测量方法和装置,属于光波技术领域。利用通过控制产生和记录不同输入条件的光脉冲在待测波导的非线性和色散以及高阶色散参数共同作用下发生的时域以及/或频谱变化的情况,利用非线性传输方程配合参数搜索算法,直接利用测量数据对待测参数进行多变量搜索,同时获取待测待波导的非线性和色散参数的数值。 |
---|