Sample detection device and method based on phase deflection technology
The invention discloses a sample detection device and method based on phase deflection, first image data of a to-be-detected sample is collected through two edge cameras, second image data is collected through a middle camera, and finally, based on the first image data and camera calibration data of...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a sample detection device and method based on phase deflection, first image data of a to-be-detected sample is collected through two edge cameras, second image data is collected through a middle camera, and finally, based on the first image data and camera calibration data of a camera group, the coordinate height of the central point of the to-be-detected sample corresponding to the central points of the two edge cameras is calculated, and finally the coordinate height of all surface points of the to-be-detected sample is calculated based on the second image data, the coordinate height of the central point of the to-be-detected sample, the calibration data of the camera group and the calibration data of a projection screen. According to the method, the coordinates of the central point of the to-be-detected sample are precisely positioned through the two edge cameras, the two edge cameras do not need to cover the whole range of the to-be-detected sample, and then the coordinate heights |
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