Preparation method of low-granularity and low-dark-spot semi-insulating gallium arsenide wafer

The invention discloses a preparation method of a low-granularity and low-dark-spot semi-insulating gallium arsenide wafer, and belongs to the technical field of preparation of semiconductor substrate materials. The method specifically comprises the following steps: proportioning 7N gallium arsenide...

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Hauptverfasser: WANG SHUNJIN, HE YONGBIN, HAN JIAXIAN, WEI HUA, LU WENHUA, PU SHIKUN, LIU TINGLONG, TANG KANGZHONG, CHEN FEIHONG, LIU HANBAO, HUANG PING, LI GUOFANG, ZHAO XINGKAI, LYU CHUNFU, HUI FENG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a preparation method of a low-granularity and low-dark-spot semi-insulating gallium arsenide wafer, and belongs to the technical field of preparation of semiconductor substrate materials. The method specifically comprises the following steps: proportioning 7N gallium arsenide polycrystals and semi-insulating gallium arsenide crystal return materials according to a certain proportion, cleaning impurities and attachments on the surfaces of the polycrystals and the return materials by using a corrosive liquid, putting the gallium arsenide polycrystals, the return materials, boron oxide and arsenic into a PBN crucible in a clean room, sleeving a high-purity carbon cap on the neck of the crucible, putting the PBN crucible into a quartz tube, placing a quartz sealing cap at the opening of the quartz tube, heating and vacuumizing the quartz tube, sealing and welding, carrying out single crystal growth by adopting a VGF process, cutting off the head and the tail of the obtained single crystal,