INSPECTION DEVICE FOR ADHESIVE STAINS ON POLARIZING PLATE AND INSPECTION METHOD FOR ADHESIVE STAINS ON POLARIZING PLATE

The present application relates to an inspection device for adhesive stains on a polarizing plate, and an inspection method for adhesive stains on a polarizing plate. The present application enables easy inspection of adhesive stains occurring on a polarizing plate, with superior visibility. 本申请案涉及一...

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Bibliographische Detailangaben
Hauptverfasser:	CUI JINGZHI, RYU JAE IL, NAM TAEK GEUN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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