INSPECTION DEVICE FOR ADHESIVE STAINS ON POLARIZING PLATE AND INSPECTION METHOD FOR ADHESIVE STAINS ON POLARIZING PLATE

The present application relates to an inspection device for adhesive stains on a polarizing plate, and an inspection method for adhesive stains on a polarizing plate. The present application enables easy inspection of adhesive stains occurring on a polarizing plate, with superior visibility. 本申请案涉及一...

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Bibliographische Detailangaben
Hauptverfasser:	CUI JINGZHI, RYU JAE IL, NAM TAEK GEUN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	The present application relates to an inspection device for adhesive stains on a polarizing plate, and an inspection method for adhesive stains on a polarizing plate. The present application enables easy inspection of adhesive stains occurring on a polarizing plate, with superior visibility. 本申请案涉及一种偏光板接着剂污点检测装置及偏光板接着剂污点检测方法接着剂。本申请案能够容易地检查形成在偏光板上的接着剂污迹，且视认性优异。