Method and device for constructing device simulation model
The embodiment of the invention discloses a method and device of constructing a device simulation model. The method comprises the steps of obtaining an impedance measurement value sequence of a to-be-constructed device; and determining the number of nodes, the number of model devices and the types o...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The embodiment of the invention discloses a method and device of constructing a device simulation model. The method comprises the steps of obtaining an impedance measurement value sequence of a to-be-constructed device; and determining the number of nodes, the number of model devices and the types of the model devices which are used for constructing a simulation model corresponding to the to-be-constructed device, and a topological relation among the various types of model devices by utilizing a preset limiting condition and the impedance measurement value sequence, so as to construct the simulation model corresponding to the to-be-constructed device, wherein the preset limiting condition comprises a limiting condition between the number of nodes in the constructed simulation model and the number of model devices, so that the simulation model of the device with the unknown structure can be accurately established.
本发明实施例公开一种器件仿真模型的构建方法及装置,该方法包括:获得待构建器件的阻抗测量值序列;利用预设限制条件以及阻抗测量值序列,确定用于构建待构建器件对应的仿真模型的节点数量、模型器件数量及其 |
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