Striped support for measuring defect position of glass substrate

The invention discloses a striped support for measuring defect positions of a glass substrate. The striped support comprises a movable base, a rotary support and a mounting frame which are sequentially connected from bottom to top. Through the arrangement of the mounting frame, the position of the measuring scale can be automatically adjusted, actual measurement is facilitated, and meanwhile, through the arrangement, the glass substrate can be stably placed in the mounting frame to be prevented from shaking during measurement; by arranging the rotary support, the glass substrate can be rotated, and stripe detection can be conveniently carried out; through the arrangement of the movable base, the stripe support can be conveniently moved, the movable base is easy and convenient to disassemble and assemble, and the stripe support is suitable for actual use. 本发明公开了一种用于测量玻璃基板缺陷位置的条纹支架，包括由下至上依次连接的移动底座、旋转支架和安装架。本发明通过设置安装架，可自动调整测量尺的位置，方便实际测量，同时，通过这种设置，玻璃基板可稳固放置于安装架内，防止测量时产生晃动；通过设置旋转支架，可对玻璃基板进行旋转，可方便条纹检测的进行；通过移动底座的设置，